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Microstructural Characterization and Mechanical Tests of Mill Rolls

Mehmet Solmaz1,
Hasan Kotan2,
Sabriye Açıkgöz3,
Mehmet Bağcı4
1Yenar Döküm A.Ş.
2Necmettin Erbakan Üniversitesi
3Karamanoğlu Mehmetbey Üniversitesi
4Konya Teknik Üniversitesi
Received:Nov 16, 2022Accepted:Dec 24, 2022Published:December 31, 2022
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Researchers studied the microstructure and mechanical properties of mill rolls to understand their wear resistance and durability.

The researchers used various techniques, including SEM, OM, XRD, and mechanical tests, to analyze the microstructure and mechanical properties of the mill rolls. They found that the rolls' microstructure and mechanical properties varied depending on their layer and temperature. The study aimed to understand the wear resistance and durability of the rolls, which is crucial for their performance in industrial applications.

Abstract

In this study, using scanning electron microscope (SEM) and optical microscope (OM), microstructural characterizations of both the surfaces and deep microstructural characterization of the rolls were carried out from the outer layer to the inner layer and the matrix structure, carbide phases and graphite structures were depicted. The types of carbide phases present in the microstructure were determined using the X-ray diffraction (XRD) technique. The densities of the inner layer and the outer layer were calculated with the samples cut from the appropriate regions. Within the scope of mechanical tests, hardness test, compression and tensile tests and impact tests were applied to the samples prepared by cutting wire erosion from the appropriate area of ​​the mill roll. The fracture surfaces obtained as a result of the impact test were analyzed by SEM and the fracture characteristics of the material were interpreted. Finally, wear tests were carried out at both room temperature and high temperature (150 ºC), and the wear resistance of the roll surface during use was determined for different temperatures.

Keywords
RollerhardnesscompressiontensileOMSEMXRD

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